SN74LS109AN3 spec.: DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

Slične SN74LS109AN3

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74LS109AN3 Datasheet i Izvanred

Proizvođač : TI

Pakiranje :

PIN : 16

Temperature : Min 0 °C | Max 70 °C

Veličina : 298 KB

Application : DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET