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SN74ABTH182646APM spec.: SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
Slične SN74ABTH182646APM
- SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
- SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
- SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
- SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
- SN74LVTH16652DLR
- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
- SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
- SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
- SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SN74ABTH182646APM Datasheet i Izvanred
Proizvođač : TI
Pakiranje : PM
PIN : 64
Temperature : Min -40 °C | Max 85 °C
Veličina : 614 KB
Application : SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN74ABTH182646APM Download PDF
